7NOVEMBER 2024The Nova ELIPSONTM utilizes advanced Raman spectroscopy technology for Optical Material Metrology to extract material properties of in-die structures by fast and non-destructive means.Taking this technology to the next level, Nova is o ering high metrology performance, field-proven reliability and stability, and an advanced algorithm suite, making this versatile metrology solution highly suitable for inline high-volume manufacturing across all semiconductor segments.A BREAKTHROUGH MATERIALS METROLOGY PLATFORMnovami.comLearn moreMEET
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